为了能够对隨机数的质量进行评估,许多研究人员提出了不同的随机序列性能测试方法。这里采用NIST SP800-22标准评估随机数质量。该标準对随机数进行以下16种测试。
1频率检验Frequency Test
2块内频数检验Frequency Test within a Block
3游程檢验Runs Test
4块内最长游程检验Test for the Longest Run of Ones in a Block
5二元矩阵秩检验Binary Matrix Rank Test
6离散傅里叶变换检验Discrete Fourier Transform Test
7非重叠模块匹配检验Non-overlapping Template Matching Test
8重叠模块匹配检验Overlapping Template Matching Test
9Maurer 的通用统计检验Maurer’s “Universal Statistical” Test
10Lempel-Ziv壓缩检验Lempel-Ziv Compression Test
11线性复杂度检验Linear Complexity Test
12序列检验Serial Test
13近似熵检验Approximate Entropy Test
14累加和檢验Cumulative Sums Test
15随机游动检验Random Excursions Test
16隨机游动状态频数检验Random Excursions Variant Test
设计了基于FPGA的真随机数发生器,该方案克服了以往随机源所必须的模拟电路中的噪声的缺点,在数字电路中产生连续的亚稳态,可以以IP核的形式予以再利用。经NIST SP800-22随机数质量评估标准测试,随机数质量优良,可以胜任各种场合对随機数的需求。
参考文献
[1]李新兵. 兼容arm9的软核处理器设计[M]. 北京: 机械工业出版社
[2]王春平, 張晓华, 赵翔. Xilinx 可编程逻辑器件设计与開发[M]. 北京: 人民邮电出版社.
[3]徐敏, 孙恺, 潘峰. 开源软核处理器OpenRisc的SOPC设计[M]. 北京: 北京航空航天大学出版社.
[4]吴燕雯, 戎蒙恬, 诸悦, 朱甫臣. 一种基于噪聲的真随机数发生器的asic设计与实现[J]. 微电子学, 2005,35(2):213-216.
[5]Bock H, Bucci M, Luzzi R. An offset-compensated oscillator-based random bit source for security applications. Lecture Notes in Computer Science, pp. 268–281 (2004)
[6]Bucci M, Luzzi R. Design of testable random bit generators. In: Cryptographic Hardware and Embedded Systems-CHES 2005, Edinburgh, UK. Lecture Notes in Computer Science, vol. 3659, pp. 147–156. Springer, Berlin (2005)
[7]Bucci M, Germani L, Luzzi R. A high-speed oscillator-based truly random number source for cryptographic applications on a smart card IC. IEEE Trans. Comput., 403-409 (2003).
[8]Bock H, Bucci M, Luzzi R. An offset-compensated oscillator-based random bit source for security applications. Lecture Notes in Computer Science, pp. 268–281 (2004)
[9]Bucci M, Luzzi R. Design of testable random bit generators. In: Cryptographic Hardware and Embedded Systems-CHES 2005, Edinburgh, UK. Lecture Notes in Computer Science, vol. 3659, pp. 147–156. Springer, Berlin (2005)
[10]Bucci M, Germani L, Luzzi R. A high-speed oscillator-based truly random number source for cryptographic applications on a smart card IC. IEEE Trans. Comput., 403–409 (2003)